Advanced uncertainty based approach for discovering erasable product patterns

Chanhee Lee, Yoonji Baek, Jerry Chun Wei Lin, Tin Truong, Unil Yun

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Fingerprint

Dive into the research topics of 'Advanced uncertainty based approach for discovering erasable product patterns'. Together they form a unique fingerprint.

Business & Economics

Engineering & Materials Science